HALT Chambers For Electronics Testing

HALT Chambers For Electronics Testing

Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS) are methods of testing product reliability aimed at finding stress-related defects in products. HALT/HASS Test Systems subject products to overstresses and accelerate fatigue to reveal weakness in design and composition by random six-degree-of-freedom vibration and rapid temperature change to test combined environmental factors.