Highly Accelerated Life Test

HALT is a process used on electronic assemblies and modules to determine weaknesses and the stress limits of a product by temperature cycling and omni-axial random vibration step stress. Inherent weaknesses in a products design and build are stimulated by increasing levels of mechanical stress. Within an accelerated timescale, faults in a product can be realised before product release and preventing failures occurring during after-sale user operation, very often during the warranty period.