Vibration Test Chambers

The simulation of vibration, temperature and climatic stress on materials and components, for example on vehicles, for testing the reliability of your products is today more important than ever. Moreover, loads occurring during transport via railroad and ship as well as through aeronautic transport also have to be considered.

Both temperature and climate influence the vibration behaviour of materials. For this reason, constant as well as cyclically changing temperatures and climates are important during vibration testing.

Unambiguous ambient conditions during testing with sine excitations, noise, sine on noise or even shock testing lead to solid results considerably faster.

Testing of new materials is part of the responsibility of the research and development department, whereas combined vibration testing as an ESS procedure (Environmental Stress Screening) is increasingly being used within manufacturing processes. A typical example is with a specific application for printed circuit boards, providing an effective method for detecting poor solder joints as well as manufacturing errors prior to delivery.

Typical ESS test profiles have temperature ramping rates of 5K/10K/15K per minute, although our products are capable of up to 30K per minute. Large amounts of circulating air improve the thermal transfer and ensure that the specimens are homogeneously stressed.

Test chambers vary in size from 600 litres up to 2200 litres. The precise height of the system can be altered to accommodate most shaker types. During testing the specimens are protected by a separate independent temperature sensor. The water in the system is automatically replenished without interruption to the operation.

The vapour-tight welded, stainless steel test enclosure with integral shelf support gives the test chamber a high level of stability during shaker operation. This design also makes the inside of the test space easy to clean.

Every electronic circuit has it's own safety mechanism which switches off the relevant function circuit and/or the entire test chamber when faults occur.