Analyst ems Low-Cost In-Circuit Test System

The Analyst ems Low-Cost In-Circuit Test (ICT) System provides the capability to quickly and easily test assemblies for common manufacturing defects such as incorrect, missing or misoriented components, and opens and shorts. These faults comprise the vast majority of problems encountered in the typical manufacturing flow. ICT systems can quickly and accurately measure continuity, capacitors, resistors, inductors, voltages, semiconductor junction voltages, and SMT connections for opens. With these basic tools, ICTs can find most faults in analog or digital assemblies before board power-up.