HTOL Testing Systems For Semiconductor Reliability

HTOL Testing Systems For Semiconductor Reliability

High Temperature Operation Life (HTOL) testing is performed to determine the effects of electrical bias and temperature on devices over extended periods during which potential inherent failures are accelerated. HTOL is used for both device qualifications prior to product release and volume manufacture. A shorter duration version of HTOL known as Burn-In can be used to screen out infant mortalities and for reliability and process monitoring during volume production.