HAST Systems With Up To 116 Electrical I/O Connections

HAST Systems With Up To 116 Electrical I/O Connections

Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.